Optimizing the efficiency of command load inspection for the Advanced CCD Imaging Spectrometer (ACIS) on the Chandra X-ray Telescope.

Details

Language :

English

ISSN :

0277786X

Issue :

1

Database :

Complementary Index

Journal :

Proceedings of SPIE

Publication Type :

Conference

Accession number :

65668691

Full Text :

https://doi.org/10.1117/12.460673