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Evaluation of charge-integrating amplifier with silicon MOSFETs for cryogenic readout.

Authors :
Noda, Manabu
Shibai, Hiroshi
Watabe, Toyoki
Hirao, Takanori
Yoda, Hiroyuki
Nagata, Hirohisa
Nakagawa, Takao
Kawada, Mitsunobu
Source :
Proceedings of SPIE; Nov1998 Part 2, Issue 1, p247-252, 6p
Publication Year :
1998

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65660172
Full Text :
https://doi.org/10.1117/12.317306