Back to Search
Start Over
Evaluation of IDEALSmile for 90-nm FLASH memory contact holes imaging with ArF scanner.
- Source :
- Proceedings of SPIE; Nov2004, Issue 1, p859-871, 13p
- Publication Year :
- 2004
Details
- Language :
- English
- ISSN :
- 0277786X
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Conference
- Accession number :
- 65623429
- Full Text :
- https://doi.org/10.1117/12.534065