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Doubly exposed patterning using mutually one-pitch step-shifted alternating phase-shift masks.

Authors :
Lee, Sung-Woo
Chung, Dong-Hoon
Shin, In-Gyun
Kim, Yong-Hoon
Choi, Seong-Woon
Han, Woo-Sung
Sohn, Jung-Min
Source :
Proceedings of SPIE; Nov2001, Issue 1, p762-769, 8p
Publication Year :
2001

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65605957
Full Text :
https://doi.org/10.1117/12.435775