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Novel Si-based composite thin films for 193/157-nm attenuated phase-shift mask (APSM) applications.
- Source :
- Proceedings of SPIE; Nov2001, Issue 1, p798-805, 8p
- Publication Year :
- 2001
Details
- Language :
- English
- ISSN :
- 0277786X
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Conference
- Accession number :
- 65605953
- Full Text :
- https://doi.org/10.1117/12.435779