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Thin film characterization using terahertz differential time-domain spectroscopy and double modulation.

Authors :
Mickan, Samuel P.
Lee, Kwang-Su
Lu, Toh-Ming
Barnat, Edward
Munch, Jesper
Abbott, Derek
Zhang, Xi-Cheng
Source :
Proceedings of SPIE; Nov2001, Issue 1, p197-209, 13p
Publication Year :
2001

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65598559
Full Text :
https://doi.org/10.1117/12.449149