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Analysis of the hysteretic behavior of silicon nanowire transistors.

Authors :
Fahem, Z.
Csaba, G.
Erlen, C. M.
Lugli, P.
Weber, W. M.
Geelhaar, L.
Riechert, H.
Source :
Physica Status Solidi (C); Jan2008, Vol. 5 Issue 1, p27-30, 4p
Publication Year :
2008

Details

Language :
English
ISSN :
18626351
Volume :
5
Issue :
1
Database :
Complementary Index
Journal :
Physica Status Solidi (C)
Publication Type :
Academic Journal
Accession number :
64958467
Full Text :
https://doi.org/10.1002/pssc.200776578