New method for the determination of the defect profile in thin layers grown over a substrate.

Details

Language :

English

ISSN :

18626351

Volume :

4

Issue :

10

Database :

Complementary Index

Journal :

Physica Status Solidi (C)

Publication Type :

Academic Journal

Accession number :

64958233

Full Text :

https://doi.org/10.1002/pssc.200675733