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AlGaN/GaN MIS-HEMTs with HfO2 gate insulator.

Authors :
Kawano, A.
Kishimoto, S.
Ohno, Y.
Maezawa, K.
Mizutani, Takashi
Ueno, H.
Ueda, T.
Tanaka, T.
Source :
Physica Status Solidi (C); Jun2007, Vol. 4 Issue 7, p2700-2703, 4p
Publication Year :
2007

Details

Language :
English
ISSN :
18626351
Volume :
4
Issue :
7
Database :
Complementary Index
Journal :
Physica Status Solidi (C)
Publication Type :
Academic Journal
Accession number :
64957967
Full Text :
https://doi.org/10.1002/pssc.200674769