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ChemInform Abstract: Room Temperature Chemical Vapor Deposition SiOF Film Formation Technology for the Interlayer in Submicron Multilevel Interconnections.

Authors :
HOMMA, T.
YAMAGUCHI, R.
MURAO, Y.
Source :
ChemInform; Jul1993, Vol. 24 Issue 27, pno-no, 1p
Publication Year :
1993

Details

Language :
English
ISSN :
09317597
Volume :
24
Issue :
27
Database :
Complementary Index
Journal :
ChemInform
Publication Type :
Academic Journal
Accession number :
64548904
Full Text :
https://doi.org/10.1002/chin.199327020