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Measuring the short-range force field above a single molecule with atomic resolution.
- Source :
- Applied Physics Letters; 8/1/2011, Vol. 99 Issue 5, p053106, 3p, 1 Diagram, 1 Graph
- Publication Year :
- 2011
-
Abstract
- We present a method that enables atomic-resolution measurements of the short-range force field above a single organic admolecule using noncontact atomic force microscopy. We have extended the standard force-mapping technique to be able to measure at close tip-molecule distances, in regions that cannot be accessed by normal constant-height or constant-frequency-shift imaging. Our technique can be used to study the interaction between a well-defined scanning probe tip and an admolecule on the atomic scale and yields atomic resolution of both molecule and substrate. Furthermore, it enables the measurement of constant-frequency-shift topographies of molecules with nonplanar adsorption geometries. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 99
- Issue :
- 5
- Database :
- Complementary Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 63882684
- Full Text :
- https://doi.org/10.1063/1.3619829