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Total Internal Reflection Optical Switch in SOI With Defect Engineered Barrier Region.

Authors :
Thomson, David J.
Reed, Graham T.
Knights, Andy P.
Yang, Pengyuan Y.
Gardes, Frederic Y.
Smith, Andy J.
Litvinenko, Konstantin L.
Source :
Journal of Lightwave Technology; Sep2010, Vol. 28 Issue 17, p2483-2491, 9p
Publication Year :
2010

Abstract

Total internal reflection optical switches offer a switching operation which can be wavelength insensitive, thermally stable and polarisation independent. The implementation of such a switch based upon carrier injection in silicon is difficult due to the long diffusion lengths of injected free carriers. In this paper experimental results are presented which show that a reflective type switching operation is obtainable if a barrier formed of defective silicon is used to reduce free carrier diffusion. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
07338724
Volume :
28
Issue :
17
Database :
Complementary Index
Journal :
Journal of Lightwave Technology
Publication Type :
Academic Journal
Accession number :
62558873
Full Text :
https://doi.org/10.1109/JLT.2010.2053914