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Effect of post-exposure delay in positive acting chemically amplified resists: An analytical study.

Authors :
Nalamasu, O.
Reichmanis, E.
Hanson, J. E.
Kanga, R. S.
Heimbrook, L. A.
Emerson, A. B.
Baiocchi, F. A.
Vaidya, S.
Source :
Polymer Engineering & Science; Nov1992, Vol. 32 Issue 21, p1565-1570, 6p
Publication Year :
1992

Details

Language :
English
ISSN :
00323888
Volume :
32
Issue :
21
Database :
Complementary Index
Journal :
Polymer Engineering & Science
Publication Type :
Academic Journal
Accession number :
62423972
Full Text :
https://doi.org/10.1002/pen.760322104