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Defect detection in complicated patterns.

Authors :
Uno, T.
Mese, M.
Ejiri, M.
Source :
Electrical Engineering in Japan; 1975, Vol. 95 Issue 2, p90-97, 8p
Publication Year :
1975

Details

Language :
English
ISSN :
04247760
Volume :
95
Issue :
2
Database :
Complementary Index
Journal :
Electrical Engineering in Japan
Publication Type :
Academic Journal
Accession number :
61976978
Full Text :
https://doi.org/10.1002/eej.4390950214