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Chromium oxide film thickness measurements using spontaneous Raman scattering.

Authors :
England, W. A.
Jenny, S. N.
Greenhalgh, D. A.
Source :
Journal of Raman Spectroscopy; Jun1984, Vol. 15 Issue 3, p156-159, 4p
Publication Year :
1984

Details

Language :
English
ISSN :
03770486
Volume :
15
Issue :
3
Database :
Complementary Index
Journal :
Journal of Raman Spectroscopy
Publication Type :
Academic Journal
Accession number :
61877612
Full Text :
https://doi.org/10.1002/jrs.1250150305