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Chromium oxide film thickness measurements using spontaneous Raman scattering.
- Source :
- Journal of Raman Spectroscopy; Jun1984, Vol. 15 Issue 3, p156-159, 4p
- Publication Year :
- 1984
Details
- Language :
- English
- ISSN :
- 03770486
- Volume :
- 15
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- Journal of Raman Spectroscopy
- Publication Type :
- Academic Journal
- Accession number :
- 61877612
- Full Text :
- https://doi.org/10.1002/jrs.1250150305