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A 10 V Josephson Voltage Standard Comparison Between NIST and INMETRO as a Link to BIPM.

Authors :
Landim, Regis Pinheiro
Tang, Yi-hua
Afonso, Edson
Ferreira, Vitor
Source :
IEEE Transactions on Instrumentation & Measurement; Jun2011, Vol. 60 Issue 7, p2353-2358, 6p
Publication Year :
2011

Abstract

This paper describes a 10 V Josephson Voltage Standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (INMETRO) using automatic data acquisition. The results were in agreement to within 1.1 nV and the mean difference between the two JVSs at 10 V is 0.54 nV with a pooled combined standard uncertainty of 1.48 nV. Considering a recent JVS comparison between NIST and the Bureau International des Poids et Mesures (BIPM), the difference between INMETRO and the BIPM thus was found to be -0.26 nV with a standard uncertainty of 1.76 nV. INMETRO JVS improvements since the 2006 INMETRO-BIPM comparison are also described. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189456
Volume :
60
Issue :
7
Database :
Complementary Index
Journal :
IEEE Transactions on Instrumentation & Measurement
Publication Type :
Academic Journal
Accession number :
61129105
Full Text :
https://doi.org/10.1109/TIM.2010.2099370