Microstructural analysis of thick AlGaN epilayers using Mg-doped AlN underlying layer.

Details

Language :

English

ISSN :

18626351

Volume :

8

Issue :

5

Database :

Complementary Index

Journal :

Physica Status Solidi (C)

Publication Type :

Academic Journal

Accession number :

60394670

Full Text :

https://doi.org/10.1002/pssc.201001114