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Rough-Sets-Based Reduction for Analog Systems Diagnostics.

Authors :
Bilski, Piotr
Wojciechowski, Jacek M.
Source :
IEEE Transactions on Instrumentation & Measurement; 03/01/2011, Vol. 60 Issue 3, p880-890, 11p
Publication Year :
2011

Abstract

This paper presents an application of the rough sets algorithms to the analog systems diagnostics. Multiple methods of discretization and reduction of the data sets obtained from measurements are tested to find effective combinations for diagnostic purposes. Useful features of rough sets are identified. Versatility and scalability of the proposed method are verified, by application to multiple analog systems belonging to various technical domains with different complexities. Practical remarks about fault detection and location in the presented systems are included. This paper is supplemented by conclusions about the effectiveness of the method and its future prospects. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189456
Volume :
60
Issue :
3
Database :
Complementary Index
Journal :
IEEE Transactions on Instrumentation & Measurement
Publication Type :
Academic Journal
Accession number :
58006666
Full Text :
https://doi.org/10.1109/TIM.2010.2060225