Micro-structural anisotropy of a-plane GaN analyzed by high resolution X-ray diffraction.

Details

Language :

English

ISSN :

18626351

Volume :

6

Database :

Complementary Index

Journal :

Physica Status Solidi (C)

Publication Type :

Academic Journal

Accession number :

57541339

Full Text :

https://doi.org/10.1002/pssc.200880964