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A Simple Method to Measure Graphite Thickness with Monolayer Precision Using Plasmon Energy Loss Imaging.
- Source :
- Microscopy & Microanalysis; Jul2010 Supplement, Vol. 16 Issue S2, p1540-1541, 2p
- Publication Year :
- 2010
-
Abstract
- Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010. [ABSTRACT FROM PUBLISHER]
- Subjects :
- ENERGY dissipation
Subjects
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 16
- Issue :
- S2
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 56860988
- Full Text :
- https://doi.org/10.1017/S1431927610059933