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A Simple Method to Measure Graphite Thickness with Monolayer Precision Using Plasmon Energy Loss Imaging.

Authors :
Boese, M.
Kumar, S.
O'Neill, A.
Lotya, M.
Zhang, H. Z.
Coleman, J. N.
Duesberg, G. S.
Source :
Microscopy & Microanalysis; Jul2010 Supplement, Vol. 16 Issue S2, p1540-1541, 2p
Publication Year :
2010

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010. [ABSTRACT FROM PUBLISHER]

Subjects

Subjects :
ENERGY dissipation

Details

Language :
English
ISSN :
14319276
Volume :
16
Issue :
S2
Database :
Complementary Index
Journal :
Microscopy & Microanalysis
Publication Type :
Academic Journal
Accession number :
56860988
Full Text :
https://doi.org/10.1017/S1431927610059933