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Nanostructural Characterization of CdTe Thin Film Photovoltaics Using Electron Backscatter Diffraction.
- Source :
- Microscopy & Microanalysis; Jul2010 Supplement, Vol. 16 Issue S2, p1352-1353, 2p
- Publication Year :
- 2010
-
Abstract
- Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010. [ABSTRACT FROM PUBLISHER]
- Subjects :
- THIN film devices
Subjects
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 16
- Issue :
- S2
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 56860820
- Full Text :
- https://doi.org/10.1017/S1431927610058253