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High Spatial Resolution Analytical Electron Microscopic Investigation of Femtosecond-Laser-Induced Crystallization of a-Si:H Films.
- Source :
- Microscopy & Microanalysis; Aug2006 Supplement, Vol. 12 Issue S02, p634-635, 2p
- Publication Year :
- 2006
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 12
- Issue :
- S02
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 56858863
- Full Text :
- https://doi.org/10.1017/S1431927606066050