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Ultrathin gate-contacts for metal-semiconductor field-effect transistor devices: An alternative approach in transparent electronics.

Authors :
Frenzel, H.
Lajn, A.
Von Wenckstern, H.
Grundmann, M.
Source :
Journal of Applied Physics; Jun2010, Vol. 107 Issue 11, p114515, 6p, 1 Chart, 4 Graphs
Publication Year :
2010

Abstract

Transparent metal-insulator-semiconductor field-effect transistors (TMISFETs) are commonly designated as one keystone of transparent circuitry. TMISFETs were demonstrated using carbon nanotubes, organics, or oxides. The optimization of their gate-insulator as well as the field-effect mobility and switching voltages is of major interest in this research field. We present an alternative approach based on metal-semiconductor field-effect transistors (MESFETs) circumventing these problems of TMISFET technology. We use ultrathin transparent rectifying contacts (TRCs) consisting of non-insulating Ag<subscript>x</subscript>O or Pt<subscript>x</subscript>O layers and a highly conducting capping layer realized by room-temperature sputtering. The process is compatible with other low-temperature, low-cost manufacturing steps. We demonstrate the potential of such TRCs for ZnO-based MESFETs having a transparency of 70% in the visible, on/off-ratios higher than 10<superscript>6</superscript> within a gate-voltage sweep of only 2.7 V and mobilities up to 12 cm<superscript>2</superscript>/V s. Inverters fabricated from these transistors exhibit maximum gain of 196 and uncertainty level of 0.36 V, outperforming inverters based on TMISFETs. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
107
Issue :
11
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
55566687
Full Text :
https://doi.org/10.1063/1.3430988