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Electron detection performance of diamond avalanche diode.

Authors :
Morishita, Hideo
Ohshima, Takashi
Hatano, Michio
Iwakaji, Yoko
Maida, Osamu
Ito, Toshimichi
Source :
Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Nov2010, Vol. 28 Issue 6, p1169-1172, 4p
Publication Year :
2010

Abstract

The authors evaluated the electron detection performance of a diamond avalanche diode (DAD) detector. In the electrode region, the gain was uniformly about 10<superscript>3</superscript> with little noise. Meanwhile, an avalanche multiplication occurred locally. In the avalanche region, a total gain of 5×10<superscript>4</superscript> was obtained. In some regions where the electric field is regarded to be intensified, the avalanche multiplication gain was estimated to be approximately 100-300, and the signal-to-noise ratio (S/N) was nearly equal to 1. The DAD can be applied to an electron detector for a scanning electron microscope due to its high gain and small dark current. However, it is necessary to improve the S/N and homogenize the gain to use the DAD detector as an electron detector. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
21662746
Volume :
28
Issue :
6
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics
Publication Type :
Academic Journal
Accession number :
55563292
Full Text :
https://doi.org/10.1116/1.3497031