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EXPERIMENTAL AND THEORETICAL CHARACTERIZATION OF THICK AND THIN FILMS FOR MICROWAVE USES ON 99.6% ALUMINA SUBSTRATES.

Authors :
RAMY, J. P.
SCHNITZLER, R.
THEBAULT, C.
Source :
Active & Passive Electronic Components; 1983, Vol. 10 Issue 2/3, p157-162, 6p
Publication Year :
1983

Details

Language :
English
ISSN :
08827516
Volume :
10
Issue :
2/3
Database :
Complementary Index
Journal :
Active & Passive Electronic Components
Publication Type :
Academic Journal
Accession number :
55364067

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