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Electrical characteristics and model for recessed channel fin field-effect transistor.

Authors :
Kim, K.
Yoshida, M.
Kahng, J.-R.
Moon, J.-S.
Roh, Y.
Source :
Electronics Letters (Institution of Engineering & Technology); 8/5/2010, Vol. 46 Issue 16, p1141-1143, 3p, 1 Black and White Photograph, 2 Diagrams, 1 Graph
Publication Year :
2010

Abstract

The recessed channel fin field-effect transistor (RC-FinFET) has been developed as a future DRAM cell transistor. A recess-channel structure is applied to the FinFET to form a RC-FinFET. A three series-connected transistor model is proposed to understand the electrical characteristics. The RC-FinFET is considered to be a serial connection of three transistors consisting of one bottom transistor and two vertical transistors. The electrical characteristics of the RC-FinFET are compared with the normal FinFET and recessed-channel-array transistor (RCAT). The short channel immunity of the RC-FinFET is better than the normal FinFET and RCAT. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00135194
Volume :
46
Issue :
16
Database :
Complementary Index
Journal :
Electronics Letters (Institution of Engineering & Technology)
Publication Type :
Academic Journal
Accession number :
52721216
Full Text :
https://doi.org/10.1049/el.2010.0727