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Crystallization, microstructure development and dielectric behaviour of glass ceramics in the system [SrO · TiO2]-[2SiO2 · B2O3]-La2O3.

Authors :
Thakur, O.
Kumar, D.
Parkash, Om
Pandey, L.
Source :
Journal of Materials Science; Jun2002, Vol. 37 Issue 12, p2597-2606, 10p
Publication Year :
2002

Abstract

Various glasses in the system (65 − x)[SrO · TiO<subscript>2</subscript>]-(35)[2SiO<subscript>2</subscript> · B<subscript>2</subscript>2O<subscript>3</subscript>]-( x)La<subscript>2</subscript>O<subscript>3</subscript>, where x = 1,5,10 (wt%) were prepared by melting in alumina crucible (1375–1575 K). Heat treatment schedules were selected from DTA plots of respective glasses. X-ray diffraction studies of glass ceramic samples containing different concentrations of La<subscript>2</subscript>O<subscript>3</subscript> revealed the formation of Sr<subscript>2</subscript>B<subscript>2</subscript>O<subscript>5</subscript>, Sr<subscript>3</subscript>Ti<subscript>2</subscript>O<subscript>7</subscript> and TiO<subscript>2</subscript> (rutile) phases. The addition of La<subscript>2</subscript>O<subscript>3</subscript> results in the development of well formed, elongated crystallites of different phases. Results of the dielectric behaviour demonstrate higher values of dielectric constant for some of the glass ceramic samples. This can be ascribed to the relaxation polarization at the crystal-glass interface due to conductivity differences between crystalline and glassy phases. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00222461
Volume :
37
Issue :
12
Database :
Complementary Index
Journal :
Journal of Materials Science
Publication Type :
Academic Journal
Accession number :
52539034
Full Text :
https://doi.org/10.1023/A:1015476631462