Noise generation and coupling mechanisms in deep-submicron ICs.

Details

Language :

English

ISSN :

07407475

Volume :

19

Issue :

5

Database :

Complementary Index

Journal :

IEEE Design & Test of Computers

Publication Type :

Academic Journal

Accession number :

52167380

Full Text :

https://doi.org/10.1109/MDT.2002.1033789