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Spot optical measurements on micromachined mirrors for photonic switching.

Authors :
Annovazzi-Lodi, V.
Benedetti, M.
Merlo, S.
Norgia, M.
Source :
IEEE Journal of Selected Topics in Quantum Electronics; May/Jun2004, Vol. 10 Issue 3, p536-544, 9p
Publication Year :
2004

Abstract

This paper describes and compares three optical methods for performing spot measurements on micromachined mirrors, designed for photonic switching in fiberoptic networks. For static characterization, two spot-position detection systems, one based on a vidicon camera and the other based on a bidimensional silicon position sensitive detector (PSD), are illustrated, tested, and compared. Moreover, the dynamic behavior has been monitored with the PSD-based detection arrangement and with a semiconductor laser feedback interferometer. Advantages and drawbacks of these methods are highlighted. Testing is reported on torsional, silicon micromachined mirrors, with a single degree of freedom. High dc voltage for static measurements, and sinusoidal or white-noise or step excitation for dynamic characterization, have been used for mirror driving. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
1077260X
Volume :
10
Issue :
3
Database :
Complementary Index
Journal :
IEEE Journal of Selected Topics in Quantum Electronics
Publication Type :
Academic Journal
Accession number :
52134779
Full Text :
https://doi.org/10.1109/JSTQE.2004.830625