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Single-Mode Emission From Vertical-Cavity Surface-Emitting Lasers With Low-Index Defects.

Authors :
Ling Bao
Nam-Heon Kim
Luke J. Mawst
N. N. Elkin
V. N. Troshchieva
D. V. Vysotsky
A. P. Napartovich
Source :
IEEE Photonics Technology Letters; 2/15/2007, Vol. 19 Issue 4, p239-241, 3p
Publication Year :
2007

Abstract

Mode confinement to low-index "defect" regions of a two-dimensional square photonic lattice has been studied as a means to realize single-spatial-mode vertical-cavity surface-emitting lasers (VCSELs). A selective etching process with two-step metal-organic chemical vapor deposition is used to fabricate the low-index defect VCSELs. A device with a 9-mum-wide aperture demonstrates 2.9-mW continuous-wave (CW) output power. The near diffraction-limited single-lobe far-field and high-resolution spectral analyses confirm single fundamental defect mode emission. Comparison studies between pulsed and CW operation indicate that thermal effects have a significant impact on the modal performance of the devices. Single-mode emission with more than 8 mW of peak pulsed power has been observed with short pulsewidth operation (0.1 mus, 2%). Improvements in thermal management are required to achieve higher CW single-mode emission in these devices [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
10411135
Volume :
19
Issue :
4
Database :
Complementary Index
Journal :
IEEE Photonics Technology Letters
Publication Type :
Academic Journal
Accession number :
52130092
Full Text :
https://doi.org/10.1109/LPT.2006.890058