Influence of edges on the exchange bias properties of ferromagnetic/antiferromagnetic nanodots.

For ferromagnetic (F)/antiferromagnetic (AF) nanodots contributions of AF spins to exchange bias is discussed. The relative weights of AF entities located at the dot edges, at the F/AF interface and in the AF grains were obtained by comparing the blocking temperature distribution of an array of nanodots with that of corresponding continuous film. Due to grain cutting, the grain size distribution is altered. We show here that the dot edges constitute additional locations for the formation of spin-glasslike AF regions at the F/AF interface. The result of patterning is thus twofold and weakens the dot ability to resist thermally activated magnetization reversal. [ABSTRACT FROM AUTHOR]