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A Low-Temperature Bonding Process Using Mixed Cu–Ag Nanoparticles.

Authors :
Morisada, Y.
Nagaoka, T.
Fukusumi, M.
Kashiwagi, Y.
Yamamoto, M.
Nakamoto, M.
Source :
Journal of Electronic Materials; Aug2010, Vol. 39 Issue 8, p1283-1288, 6p, 1 Black and White Photograph, 4 Diagrams, 3 Graphs
Publication Year :
2010

Abstract

A low-temperature bonding process to form joints with high strength and ionic migration resistance using mixed Cu–Ag nanoparticles was studied. Although it was difficult to obtain strong joints using Cu nanoparticles, with the addition of Ag nanoparticles to the Cu nanoparticles the bonding strength of the Cu-to-Cu joints increased. The joints formed by the mixed Cu–Ag nanoparticles at 350°C exhibited a high bonding strength of ~50 MPa. Counterelectrodes made of the mixed Cu–Ag nanoparticles had four times higher ionic migration resistance compared with counterelectrodes made only of Ag nanoparticles. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03615235
Volume :
39
Issue :
8
Database :
Complementary Index
Journal :
Journal of Electronic Materials
Publication Type :
Academic Journal
Accession number :
51952357
Full Text :
https://doi.org/10.1007/s11664-010-1195-3