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Growth of epitaxial iron nitride ultrathin film on zinc-blende gallium nitride.
- Source :
- Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jul2010, Vol. 28 Issue 4, p536-540, 5p, 1 Color Photograph, 1 Diagram, 5 Graphs
- Publication Year :
- 2010
-
Abstract
- The authors report the growth of iron nitride on zinc-blende gallium nitride using molecular beam epitaxy. First, zinc-blende GaN is grown on a magnesium oxide substrate having (001) orientation; second, an ultrathin layer of FeN is grown on top of the GaN layer. In situ reflection high-energy electron diffraction is used to monitor the surface during growth, and a well-defined epitaxial relationship is observed. Cross-sectional transmission electron microscopy is used to reveal the epitaxial continuity at the gallium nitride-iron nitride interface. Surface morphology of the iron nitride, similar to yet different from that of the GaN substrate, can be described as plateau valley. The FeN chemical stoichiometry is probed using both bulk and surface sensitive methods, and the magnetic properties of the sample are revealed. [ABSTRACT FROM AUTHOR]
- Subjects :
- IRON compounds
NITRIDES
EPITAXY
THIN films
GALLIUM nitride
MAGNESIUM oxide
Subjects
Details
- Language :
- English
- ISSN :
- 07342101
- Volume :
- 28
- Issue :
- 4
- Database :
- Complementary Index
- Journal :
- Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films
- Publication Type :
- Academic Journal
- Accession number :
- 51849487
- Full Text :
- https://doi.org/10.1116/1.3425805