Back to Search
Start Over
Sn-Zn-Al Pb-free solder—An inherent barrier solder for Cu contact.
- Source :
- Journal of Electronic Materials; Sep2001, Vol. 30 Issue 9, p1068-1072, 5p
- Publication Year :
- 2001
-
Abstract
- Flip chip solder bumps were produced on Cu contact applying Sn-9Zn-xAl Pb-free solder by dipping method. The solder bumps were tested under 85 C/85% RH (relative humidity) or at 150 C for 1000 hours to explore the shear strength and the interfacial interaction behavior. Experimental results revealed that Al and Zn, while not Sn, diffuse to the Cu/solder interface during the extended period test. A thin layer of Al<subscript>4.2</subscript>Cu<subscript>3.2</subscript>Zn<subscript>0.7</subscript> compound, characterized by XRD, was formed at the interface of the as-produced solder bump. This compound which resulted from the gathering of Al at the interface, provides a barrier to Sn diffusion toward Cu substrate and, thus, no Cu-Sn compound was detected. This is the first time to find a Sn-containing solder which, in contact with Cu, does not form Cu-Sn intermetallic compound during heat treatment and, thus, the Sn-Zn-Al solder is termed an inherent barrier solder. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 03615235
- Volume :
- 30
- Issue :
- 9
- Database :
- Complementary Index
- Journal :
- Journal of Electronic Materials
- Publication Type :
- Academic Journal
- Accession number :
- 50080665
- Full Text :
- https://doi.org/10.1007/s11664-001-0131-y