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Sn-Zn-Al Pb-free solder—An inherent barrier solder for Cu contact.

Authors :
Lin, Kwang-Lung
Hsu, Hui-Min
Source :
Journal of Electronic Materials; Sep2001, Vol. 30 Issue 9, p1068-1072, 5p
Publication Year :
2001

Abstract

Flip chip solder bumps were produced on Cu contact applying Sn-9Zn-xAl Pb-free solder by dipping method. The solder bumps were tested under 85 C/85% RH (relative humidity) or at 150 C for 1000 hours to explore the shear strength and the interfacial interaction behavior. Experimental results revealed that Al and Zn, while not Sn, diffuse to the Cu/solder interface during the extended period test. A thin layer of Al<subscript>4.2</subscript>Cu<subscript>3.2</subscript>Zn<subscript>0.7</subscript> compound, characterized by XRD, was formed at the interface of the as-produced solder bump. This compound which resulted from the gathering of Al at the interface, provides a barrier to Sn diffusion toward Cu substrate and, thus, no Cu-Sn compound was detected. This is the first time to find a Sn-containing solder which, in contact with Cu, does not form Cu-Sn intermetallic compound during heat treatment and, thus, the Sn-Zn-Al solder is termed an inherent barrier solder. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03615235
Volume :
30
Issue :
9
Database :
Complementary Index
Journal :
Journal of Electronic Materials
Publication Type :
Academic Journal
Accession number :
50080665
Full Text :
https://doi.org/10.1007/s11664-001-0131-y