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A Survey of Test Techniques for MCM Substrates.
- Source :
- Journal of Electronic Testing; Feb1997, Vol. 10 Issue 1/2, p27-38, 12p
- Publication Year :
- 1997
-
Abstract
- This paper provides a survey of MCM substrate test techniques. Test techniques that are based on capacitance,resistance, electron beam, latent opens, time domain network analysis(TDNA) and RF resonator are discussed. In this paper, test techniquesare applied to interconnect testing. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 09238174
- Volume :
- 10
- Issue :
- 1/2
- Database :
- Complementary Index
- Journal :
- Journal of Electronic Testing
- Publication Type :
- Academic Journal
- Accession number :
- 50040546
- Full Text :
- https://doi.org/10.1023/A:1008214330042