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A Survey of Test Techniques for MCM Substrates.

Authors :
Swaminathan, Madhavan
Kim, Bruce
Chatterjee, Abhijit
Source :
Journal of Electronic Testing; Feb1997, Vol. 10 Issue 1/2, p27-38, 12p
Publication Year :
1997

Abstract

This paper provides a survey of MCM substrate test techniques. Test techniques that are based on capacitance,resistance, electron beam, latent opens, time domain network analysis(TDNA) and RF resonator are discussed. In this paper, test techniquesare applied to interconnect testing. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09238174
Volume :
10
Issue :
1/2
Database :
Complementary Index
Journal :
Journal of Electronic Testing
Publication Type :
Academic Journal
Accession number :
50040546
Full Text :
https://doi.org/10.1023/A:1008214330042