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Photoluminescence spectroscopy and positron annihilation spectroscopy probe of alloying and annealing effects in nonpolar m-plane ZnMgO thin films.

Authors :
Yang, A. L.
Song, H. P.
Liang, D. C.
Wei, H. Y.
Liu, X. L.
Jin, P.
Qin, X. B.
Yang, S. Y.
Zhu, Q. S.
Wang, Z. G.
Source :
Applied Physics Letters; 4/12/2010, Vol. 96 Issue 15, p151904, 3p, 4 Graphs
Publication Year :
2010

Abstract

Temperature-dependent photoluminescence characteristics of non-polar m-plane ZnO and ZnMgO alloy films grown by metal organic chemical vapor deposition have been studied. The enhancement in emission intensity caused by localized excitons in m-plane ZnMgO alloy films was directly observed and it can be further improved after annealing in nitrogen. The concentration of Zn vacancies in the films was increased by alloying with Mg, which was detected by positron annihilation spectroscopy. This result is very important to directly explain why undoped Zn<subscript>1-x</subscript>Mg<subscript>x</subscript>O thin films can show p-type conduction by controlling Mg content, as discussed by Li et al. [Appl. Phys. Lett. 91, 232115 (2007)]. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
96
Issue :
15
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
49193346
Full Text :
https://doi.org/10.1063/1.3394012