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Tailoring the magnetization reversal of elliptical dots using exchange bias (invited).

Authors :
Sort, J.
Buchanan, K. S.
Pearson, J. E.
Hoffmann, A.
Menéndez, E.
Salazar-Alvarez, G.
Baró, M. D.
Miron, M.
Rodmacq, B.
Dieny, B.
Nogués, J.
Source :
Journal of Applied Physics; Apr2008, Vol. 103 Issue 7, p07C109, 5p
Publication Year :
2008

Abstract

Exchange bias effects have been studied in elliptical dots composed of ferromagnetic Ni<subscript>80</subscript>Fe<subscript>20</subscript>–antiferromagnetic Ir<subscript>20</subscript>Mn<subscript>80</subscript> bilayers. The magnetization reversal mechanisms and magnetic configurations have been investigated by magneto-optic Kerr effect and magnetic force microscopy. Although the obtained bias fields in these dots are relatively small, the magnetization reversal is found to be influenced by the ferromagnetic–antiferromagnetic coupling. Namely, for some off-axis angles of measurement, the magnetization reversal mechanism of the Ni<subscript>80</subscript>Fe<subscript>20</subscript>–Ir<subscript>20</subscript>Mn<subscript>80</subscript> ellipses depends on whether exchange bias is induced along the minor or major axis of the ellipses. Hence, exchange bias is shown to be an effective means for tailoring the magnetization reversal of elliptical dots after sample fabrication. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
103
Issue :
7
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
48992492
Full Text :
https://doi.org/10.1063/1.2840467