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Characteristics of Double-Gate Ga-In-Zn-O Thin-Film Transistor.
- Source :
- IEEE Electron Device Letters; Mar2010, Vol. 31 Issue 3, p219-221, 3p
- Publication Year :
- 2010
-
Abstract
- A Ga-In-Zn-O thin-film transistor with double-gate structure is reported. Enhancement-mode operation that is essential to the constitution of a low-power digital circuitry is easily achieved when the upper and lower gate electrodes are tied together. The saturation mobility and the subthreshold swing are improved from 3.65 cm<superscript>2</superscript>/(V · s) and 0.44 V/dec to 18.9 cm<superscript>2</superscript>/(V · s) and 0.14 V/dec, respectively, compared with the single-gate structure. We can modulate the threshold voltage of either gate by adjusting the bias on the other gate. [ABSTRACT FROM AUTHOR]
- Subjects :
- TRANSISTORS
THIN-film circuits
DIGITAL electronics
ELECTRONICS
SEMICONDUCTORS
Subjects
Details
- Language :
- English
- ISSN :
- 07413106
- Volume :
- 31
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- IEEE Electron Device Letters
- Publication Type :
- Academic Journal
- Accession number :
- 48381401
- Full Text :
- https://doi.org/10.1109/LED.2009.2038805