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Characteristics of Double-Gate Ga-In-Zn-O Thin-Film Transistor.

Authors :
Kyoung-Seok Son
Ji-Sim Jung
Kwang-Hee Lee
Tae-Sang Kim
Joon-Seok Park
Yun-Hyuk Choi
KeeChan Park
Jang-Yeon Kwon
Bonwon Koo
Sang-Yoon Lee
Source :
IEEE Electron Device Letters; Mar2010, Vol. 31 Issue 3, p219-221, 3p
Publication Year :
2010

Abstract

A Ga-In-Zn-O thin-film transistor with double-gate structure is reported. Enhancement-mode operation that is essential to the constitution of a low-power digital circuitry is easily achieved when the upper and lower gate electrodes are tied together. The saturation mobility and the subthreshold swing are improved from 3.65 cm<superscript>2</superscript>/(V · s) and 0.44 V/dec to 18.9 cm<superscript>2</superscript>/(V · s) and 0.14 V/dec, respectively, compared with the single-gate structure. We can modulate the threshold voltage of either gate by adjusting the bias on the other gate. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
07413106
Volume :
31
Issue :
3
Database :
Complementary Index
Journal :
IEEE Electron Device Letters
Publication Type :
Academic Journal
Accession number :
48381401
Full Text :
https://doi.org/10.1109/LED.2009.2038805