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Toward determinism in surface damaging of dielectrics using few-cycle laser pulses.

Authors :
Sanner, N.
Utéza, O.
Chimier, B.
Sentis, M.
Lassonde, P.
Légaré, F.
Kieffer, J. C.
Source :
Applied Physics Letters; 2/15/2010, Vol. 96 Issue 7, p071111, 3p, 1 Diagram, 3 Graphs
Publication Year :
2010

Abstract

We introduce a quantitative measurement of the determinism of laser-induced damaging at the surface of a dielectric material, e.g., fused silica. Using laser pulses ranging from 7 to 300 fs, we demonstrate that laser damage occurrence tends to be dramatically deterministic at 7 fs, which is attributed to the increasing importance of tunneling ionization as the major channel for the generation of free-carriers in the conduction band. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
96
Issue :
7
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
48199508
Full Text :
https://doi.org/10.1063/1.3309700