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Energy dispersive measurements of anisotropic diffraction mottling effects.

Authors :
Wendt, S.
Gray, J.
Beckman, S.
Source :
AIP Conference Proceedings; 2001, Vol. 557 Issue 1, p514, 7p, 5 Diagrams, 4 Graphs
Publication Year :
2001

Abstract

Anisotropic x-ray diffraction occurring in metals such as nickel, aluminum and titanium was studied using an energy dispersive detector. The objective was to develop methods to reduce or eliminate the diffraction and/or the resulting mottling that appears on radiographs. It was found that the majority of the diffraction occurred at multiple x-ray energies ranging from 70 to 150 keV. Heavy filtering in that energy region reduced the mottling and resulted in a clearer radiographic image with some loss in sensitivity. © 2001 American Institute of Physics. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Volume :
557
Issue :
1
Database :
Complementary Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
4759236