Cite
Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs.
MLA
Pellish, Jonathan A., et al. “Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs.” IEEE Transactions on Nuclear Science, vol. 56, no. 6, Dec. 2009, pp. 3078–84. EBSCOhost, https://doi.org/10.1109/TNS.2009.2034158.
APA
Pellish, J. A., Reed, R. A., McMorrow, D., Vizkelethy, G., Cavrois, V. F., Baggio, J., Paillet, P., Duhamel, O., Moen, K. A., Phillips, S. D., Diestelhorst, R. M., Cressler, J. D., Sutton, A. K., Raman, A., Turowski, M., Dodd, P. E., Alles, M. L., Schrimpf, R. D., Marshall, P. W., & LaBel, K. A. (2009). Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs. IEEE Transactions on Nuclear Science, 56(6), 3078–3084. https://doi.org/10.1109/TNS.2009.2034158
Chicago
Pellish, Jonathan A., Robert A. Reed, Dale McMorrow, Gyorgy Vizkelethy, Veronique Ferlet Cavrois, Jacques Baggio, Philippe Paillet, et al. 2009. “Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs.” IEEE Transactions on Nuclear Science 56 (6): 3078–84. doi:10.1109/TNS.2009.2034158.