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Graded composition and valence states in self-forming barrier layers at Cu–Mn/SiO2 interface.

Authors :
Otsuka, Y.
Koike, J.
Sako, H.
Ishibashi, K.
Kawasaki, N.
Chung, S. M.
Tanaka, I.
Source :
Applied Physics Letters; 1/4/2010, Vol. 96 Issue 1, p012101, 3p, 1 Diagram, 3 Graphs
Publication Year :
2010

Abstract

A self-forming diffusion barrier (SFB) layer was formed at Cu–Mn/SiO<subscript>2</subscript> interface. Spatial variation of the chemical composition and valence state of the elements in the SFB was investigated in a subnanometer resolution using electron energy loss spectroscopy and transmission electron microscopy. The SFB was found to have a layered structure with graded compositions of nanocrystalline MnO and amorphous MnSiO<subscript>3</subscript>. The valence state of Mn was found to be +2 in the MnO layer and gradually increased to +3 in the MnSiO<subscript>3</subscript> layer. The reported dielectric constant of the SFB could be explained by the observed composition and microstructure. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
96
Issue :
1
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
47416490
Full Text :
https://doi.org/10.1063/1.3269602