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An application of electrically cooled Si detector to fast neutral measurement on CHS.

Authors :
Yamamoto, T.
Osakabe, M.
Isobe, M.
Yoshimura, Y.
Kumazawa, R.
Mutoh, T.
Watari, T.
Takeiri, Y.
Kaneko, O.
Takahasi, C.
Matsuoka, K.
Kado, S.
Source :
Review of Scientific Instruments; Jan2001, Vol. 72 Issue 1, p615, 4p
Publication Year :
2001

Abstract

A new type of fast neutral particle analyzer using Si diode cooled by Peltier module has been designed and developed. It is known that leak current in a solid-state detector is reduced by its use in low temperature. It is shown in this article that Peltier effect provides a very handy way of cooling the detector as long as a temperature around 0 °C is aimed at. The detector was easily cooled down to -1.6 °C and the performance of the detector was studied by the use of x/γ rays from [sup 241]Am. The leak current was remarkably reduced as the detector is cooled improving energy resolution from 9.2 keV at room temperature to 4.3 keV at -1.6 °C. In addition, the lower detectable energy limit was expanded from 25 keV to 14 keV. A Si detector is also sensitive to visible light and x ray. Therefore, the detector of our “reference design” is furnished with an evaporated 1000-Å-thick aluminum layer to reduce the visible light and with a lead collimator to reduce the x ray. The detector was finally installed on the Compact Helical System device for a test of overall performance and an energy spectrum from a diagnostic neutral beam was successfully measured. This test was conducted without an Al layer and this result suggests a possibility of eliminating it. © 2001 American Institute of Physics. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00346748
Volume :
72
Issue :
1
Database :
Complementary Index
Journal :
Review of Scientific Instruments
Publication Type :
Academic Journal
Accession number :
4716820