X-ray reflectometry of nanocomposite metal-dielectric films.

Authors :: Petrakov, A. P.
Kotov, L. N.
Kalinin, Yu. E.
Sitnikov, A. V.
Source :: Inorganic Materials; Dec2009, Vol. 45 Issue 14, p1640-1642, 3p, 1 Chart, 2 Graphs
Publication Year :: 2009
Abstract: The technique of X-ray reflectometry used for studying the sizes of metallic and dielectric inclusions in nanocomposite films (Fe<subscript>45</subscript>Co<subscript>45</subscript>Zr<subscript>10</subscript>) · (Al<subscript>2</subscript>O<subscript>3</subscript>)<subscript>100− x</subscript> depending on their composition is described. The size of isolated metallic inclusions increases with an increase in metallic phase concentration and reaches its maximum in the region of the percolation threshold. Above this threshold, metallic inclusions merge, thus forming a matrix with dielectric inclusions. [ABSTRACT FROM AUTHOR]