Back to Search Start Over

Cross-Interaction Between Au/Sn and Cu/Sn Interfacial Reactions.

Authors :
Yen, Yee-Wen
Tseng, H. W.
Zeng, K.
Wang, S. J.
Liu, C. Y.
Source :
Journal of Electronic Materials; Nov2009, Vol. 38 Issue 11, p2257-2263, 7p, 9 Black and White Photographs, 1 Diagram, 5 Graphs
Publication Year :
2009

Abstract

The cross-interaction between Sn/Cu and Sn/Au interfacial reactions in an Au/Sn/Cu sandwich structure was studied. Field-emission electron probe microanalysis (FE-EPMA) revealed that the Cu content in the three Au-Sn phases (AuSn, AuSn<subscript>2</subscript>, and AuSn<subscript>4</subscript>) was very low, less than 1 at.%. This meansā£that Cu from the opposite Cu foil did not participate in the interfacial reaction at the Sn/Au interface. On the opposite Sn/Cu side, Au-substituted (Cu,Au)<subscript>6</subscript>Sn<subscript>5</subscript> formed within the initial 1 min of reflow. With prolonged reflow, the Au content in the Au-substituted (Cu,Au)<subscript>6</subscript>Sn<subscript>5</subscript> increased and it transformed into a Cu-substituted (Au,Cu)Sn phase with 25 at.% Cu after 1 min of reflow at 250°C. The x-ray diffraction (XRD) pattern confirmed the phase transformation of Au-substituted (Cu,Au)<subscript>6</subscript>Sn<subscript>5</subscript> to Cu-substituted (Au,Cu)Sn phase. In addition, there was greater Au consumption in the Au/Sn/Cu sandwich joint structure than in the single Au/Sn reaction case, due to some of the Au participating in the opposite Sn/Cu interfacial reaction. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03615235
Volume :
38
Issue :
11
Database :
Complementary Index
Journal :
Journal of Electronic Materials
Publication Type :
Academic Journal
Accession number :
44513692
Full Text :
https://doi.org/10.1007/s11664-009-0920-2