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Mo-Based Proximity Bilayers for TES: Microstructure and Properties.
- Source :
- IEEE Transactions on Applied Superconductivity; Jun2009 Part 1 of 3, Vol. 19 Issue 3, p460-464, 5p, 1 Chart, 4 Graphs
- Publication Year :
- 2009
-
Abstract
- We report on the fabrication and characterization of Mo films, Mo/Au and Mo/Cu bilayers for Transition Edge Sensors (TES). The fabrication conditions (at room temperature) have been varied to achieve layers with the required properties for TES applications. The dependence of their functional properties (i.e. electrical resistivity and superconducting critical temperature) on microstructure (grain size, stress) is investigated. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 10518223
- Volume :
- 19
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Applied Superconductivity
- Publication Type :
- Academic Journal
- Accession number :
- 43868738
- Full Text :
- https://doi.org/10.1109/TASC.2009.2019052