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Solution-processed InGaZnO-based thin film transistors for printed electronics applications.

Authors :
Jun Hyung Lim
Jong Hyun Shim
Jun Hyuk Choi
Jinho Joo
Kyung Park
Haseok Jeon
Mi Ran Moon
Donggeun Jung
Hyoungsub Kim
Hoo-Jeong Lee
Source :
Applied Physics Letters; 7/6/2009, Vol. 95 Issue 1, p012108, 3p, 1 Diagram, 3 Graphs
Publication Year :
2009

Abstract

This letter reports the utility of using the sol-gel process for exploring the library of multicomponent ZnO-based oxides as an active layer of thin film transistors. We chose InGaZnO as a starting material and modulated the Ga content to examine the potential of this material. Increasing the Ga ratio from 0.1 to 1 brought about a dynamic shift in the electrical behavior from conductor to semiconductor. This exploratory work critically helped us fabricate a device with robust device performance (a mobility of 1∼2 cm<superscript>2</superscript> V<superscript>-1</superscript> s<superscript>-1</superscript> for the 400 °C-sintered samples and 0.2 cm<superscript>2</superscript> V<superscript>-1</superscript> s<superscript>-1</superscript> for the 300 °C-sintered samples). [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
95
Issue :
1
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
43158429
Full Text :
https://doi.org/10.1063/1.3157265