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Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer...
- Source :
- Review of Scientific Instruments; May97, Vol. 68 Issue 5, p1939, 6p, 2 Diagrams, 6 Graphs
- Publication Year :
- 1997
-
Abstract
- Utilizes a W/Si multilayer polarimeter to determine the degree of circular polarization of the soft x-ray radiation of the European Synchrotron Radiation Facility helical undulator HELIOS I. Fabrication of the multilayer polarimeter; Multilayer characterization; Determination of the degree of circular polarization; Characterization of HELIOS I.
- Subjects :
- POLARISCOPE
GRENZ rays
POLARIZATION (Nuclear physics)
Subjects
Details
- Language :
- English
- ISSN :
- 00346748
- Volume :
- 68
- Issue :
- 5
- Database :
- Complementary Index
- Journal :
- Review of Scientific Instruments
- Publication Type :
- Academic Journal
- Accession number :
- 4290412
- Full Text :
- https://doi.org/10.1063/1.1148081