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Newly developed matrix-type semiconductor detector for temporally and spatially resolved x-ray...
- Source :
- Review of Scientific Instruments; Jan1999, Vol. 70 Issue 1, p633, 4p, 2 Diagrams, 7 Graphs
- Publication Year :
- 1999
-
Abstract
- Describes the development of a matrix-type semiconductor x-ray detector for the purpose of determining measurements of temporally and spatially resolved electron temperatures during a single plasma shot. Specifications for the semiconductor detector; Testing of the device in the GAMMA 10 tandem mirror; Achievement of plasma profiles.
- Subjects :
- DETECTORS
SEMICONDUCTORS
ELECTRONS
PLASMA confinement
Subjects
Details
- Language :
- English
- ISSN :
- 00346748
- Volume :
- 70
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Review of Scientific Instruments
- Publication Type :
- Academic Journal
- Accession number :
- 4270396
- Full Text :
- https://doi.org/10.1063/1.1149522