Non-thermal melting in semiconductors measured at femtosecond resolution.

Authors :: Rousse, A.
Rischel, C.
Fourmaux, S.
Uschmann, I.
Sebban, S.
Grillon, G.
Balcou, Ph.
Forster, E.
Geindre, J.P.
Audebert, P.
Gauthier, J.C.
Hulin, D.
Source :: Nature; 3/1/2001, Vol. 410 Issue 6824, p65, 4p, 2 Graphs
Publication Year :: 2001
Abstract: Presents measurements of the characteristic melting time of InSb with a technique of ultrafast time-resolved X-ray diffraction that provides a direct probe of the changing atomic structure. How the electronic energy is converted into thermal motions; Application for this ability to obtain the quantitative structural characterization of non-thermal processes in semiconductors.