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Non-thermal melting in semiconductors measured at femtosecond resolution.
- Source :
- Nature; 3/1/2001, Vol. 410 Issue 6824, p65, 4p, 2 Graphs
- Publication Year :
- 2001
-
Abstract
- Presents measurements of the characteristic melting time of InSb with a technique of ultrafast time-resolved X-ray diffraction that provides a direct probe of the changing atomic structure. How the electronic energy is converted into thermal motions; Application for this ability to obtain the quantitative structural characterization of non-thermal processes in semiconductors.
- Subjects :
- SEMICONDUCTORS
FUSION (Phase transformation)
OPTICAL spectrometers
ATOMIC structure
Subjects
Details
- Language :
- English
- ISSN :
- 00280836
- Volume :
- 410
- Issue :
- 6824
- Database :
- Complementary Index
- Journal :
- Nature
- Publication Type :
- Academic Journal
- Accession number :
- 4181117
- Full Text :
- https://doi.org/10.1038/35065045